Koo, H.[Koo, H.]; Shin, J.[Shin, J.]; Choi, W.[Choi, W.]; Bin, S.[Bin, S.]; Oh, H.[Oh, H.]; Lim, H.[Lim, H.]; Lee, K.[Lee, K.]; Hwang, K.C.[Hwang, K.C.]; Yang, Y.[Yang, Y.]
ArticleIssue Date2022CitationIEEE Access, v.10, pp.125365 - 125375PublisherInstitute of Electrical and Electronics Engineers Inc.