Bae, Sooncheol; Oh, Hansik; Choi, Woojin; Shin, Jaekyung; Chen, Yifei; Jeon, Hyeongjin; Choi, Young Chan; Nam, Sunwoo; Bin, Soohyun; Lee, Yoonjung, et al.
ArticleIssue Date2024CitationIEEE Access, v.12, pp 41980 - 41987PublisherInstitute of Electrical and Electronics Engineers Inc.