Kim, J.H.[Kim, J.H.]; Seo, S.H.[Seo, S.H.]; Moon, T.Y.[Moon, T.Y.]; Son, C.W.[Son, C.W.]; Kwon, K.H.[Kwon, K.H.]; Jeon, J.W.[Jeon, J.W.]; Hwang, S.H.[Hwang, S.H.]
ArticleIssue Date2008CitationIEEE International Conference on Industrial Informatics (INDIN), pp.1149 - 1153