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A study of devs-based process scheduling on multi-user semiconductor test equipment
- Authors
- Lim S.[Lim S.]; Han Y.[Han Y.]; Lee C.[Lee C.]
- Issue Date
- 2013
- Keywords
- DEVS; Equipment efficiency; Idle time; Process scheduling
- Citation
- 12th International Conference on Modeling and Applied Simulation, MAS 2013, Held at the International Multidisciplinary Modeling and Simulation Multiconference, I3M 2013, pp.141 - 143
- Journal Title
- 12th International Conference on Modeling and Applied Simulation, MAS 2013, Held at the International Multidisciplinary Modeling and Simulation Multiconference, I3M 2013
- Start Page
- 141
- End Page
- 143
- Abstract
- Single processor semiconductor test equipment inevitably experiences idle time between tests. This idle time is increased when multiple operators use the same equipment. An increase in idle time is considered a loss factor and produces low equipment efficiency; therefore, it is important to decrease it. In this paper, we offer two methods to effectively decrease idle time in multi-user test equipment. The methods proposed here were developed using an atomic model and were coupled with discrete event system specification methodology. Features of our model include idle time that can be decreased more than the typical sequence and equipment status that can be monitored beforehand without adding extra time.
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