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Effect of p-type a-SiO:H buffer layer at the interface of TCO and p-type layer in hydrogenated amorphous silicon solar cells

Authors
Kim, Y[Kim, Youngkuk]Iftiquar, SM[Iftiquar, S. M.]Park, J[Park, Jinjoo]Lee, J[Lee, Jeongchul]Yi, J[Yi, Junsin]
Issue Date
Nov-2012
Publisher
KOREAN ASSOC CRYSTAL GROWTH, INC
Keywords
Hydrogenated amorphous silicon solar cell; RF PECV
Citation
JOURNAL OF CERAMIC PROCESSING RESEARCH, v.13, pp.S336 - S340
Indexed
SCIE
SCOPUS
KCI
Journal Title
JOURNAL OF CERAMIC PROCESSING RESEARCH
Volume
13
Start Page
S336
End Page
S340
URI
https://scholarworks.bwise.kr/skku/handle/2021.sw.skku/63820
ISSN
1229-9162
Abstract
Wide band gap p-type hydrogenated amorphous silicon oxide (a-SiO:H) buffer layer has been used at the interface of transparent conductive oxide (TCO) and hydrogenated amorphous silicon (a-Si:H) p-type layer of a p-i-n type a-Si:H solar cell. Introduction of 5 nm thick buffer layer improves in blue response of the cell along with 0.5% enhancement of photovoltaic conversion efficiency (eta). The cells with buffer layer show higher open circuit voltage (V-oc), fill factor (FF), short circuit current density (J(sc)) and improved blue response with respect to the cell without buffer layer.
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