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Bulk current injection test modeling using an equivalent circuit for 1.8V mobile ICs

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dc.contributor.authorKwak S.[Kwak S.]-
dc.contributor.authorJo J.[Jo J.]-
dc.contributor.authorNoh S.[Noh S.]-
dc.contributor.authorLee H.[Lee H.]-
dc.contributor.authorNah W.[Nah W.]-
dc.contributor.authorKim S.[Kim S.]-
dc.date.accessioned2021-08-05T14:51:05Z-
dc.date.available2021-08-05T14:51:05Z-
dc.date.created2016-08-06-
dc.date.issued2012-
dc.identifier.urihttps://scholarworks.bwise.kr/skku/handle/2021.sw.skku/67187-
dc.description.abstractThis paper shows a novel simulation method for bulk current injection (BCI) tests of I/O buffer circuits of mobile system memory. The simulation model consists of BCI probe, directional coupler, PCB, PKG, and IC. The proposed method is based on a behavioural I/O buffer model using a pulse generator as an input. A detailed simulation flow is introduced and validated through simulations performed on several injection probe loading conditions using a power decoupling capacitor and an on-chip decoupling capacitor. © 2012 IEEE.-
dc.subjectBulk current injections-
dc.subjectDecoupling capacitor-
dc.subjectI/O buffer-
dc.subjectI/O buffer circuits-
dc.subjectLoading condition-
dc.subjectMobile systems-
dc.subjectOn-chip Decoupling capacitors-
dc.subjectSimulation flow-
dc.subjectSimulation methods-
dc.subjectSimulation model-
dc.subjectComputer simulation-
dc.subjectElectromagnetic compatibility-
dc.subjectPolychlorinated biphenyls-
dc.subjectProbes-
dc.subjectPulse generators-
dc.subjectCapacitors-
dc.titleBulk current injection test modeling using an equivalent circuit for 1.8V mobile ICs-
dc.typeArticle-
dc.contributor.affiliatedAuthorKwak S.[Kwak S.]-
dc.contributor.affiliatedAuthorJo J.[Jo J.]-
dc.contributor.affiliatedAuthorNoh S.[Noh S.]-
dc.contributor.affiliatedAuthorLee H.[Lee H.]-
dc.contributor.affiliatedAuthorNah W.[Nah W.]-
dc.contributor.affiliatedAuthorKim S.[Kim S.]-
dc.identifier.doi10.1109/APEMC.2012.6237908-
dc.identifier.scopusid2-s2.0-84864862261-
dc.identifier.bibliographicCitationcccc2012 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2012 - Proceedings, pp.565 - 568-
dc.relation.isPartOfcccc2012 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2012 - Proceedings-
dc.citation.titlecccc2012 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2012 - Proceedings-
dc.citation.startPage565-
dc.citation.endPage568-
dc.type.rimsART-
dc.description.journalClass3-
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Information and Communication Engineering > Department of Semiconductor Systems Engineering > 1. Journal Articles
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