Superconducting Fault Current Limiter Application for Reduction of the Transformer Inrush Current: A Decision Scheme of the Optimal Insertion Resistance
- Authors
- Seo, HC[Seo, Hun-Chul]; Kim, CH[Kim, Chul-Hwan]; Rhee, SB[Rhee, Sang-Bong]; Kim, JC[Kim, Jae-Chul]; Hyun, OB[Hyun, Ok-Bae]
- Issue Date
- Aug-2010
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- Keywords
- Electromagnetic transient program (EMTP); optimal insertion resistance; superconducting fault current limiter (SFCL); transformer inrush current
- Citation
- IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, v.20, no.4, pp.2255 - 2264
- Indexed
- SCIE
SCOPUS
- Journal Title
- IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY
- Volume
- 20
- Number
- 4
- Start Page
- 2255
- End Page
- 2264
- URI
- https://scholarworks.bwise.kr/skku/handle/2021.sw.skku/73668
- DOI
- 10.1109/TASC.2010.2048214
- ISSN
- 1051-8223
- Abstract
- A conventional superconducting fault current limiter (SFCL) is usually only connected to a power system for fault current limitation. The study described in this paper, however, attempts to use the hybrid SFCL application to reduce the transformer inrush current. To accomplish this, this paper first suggests the concepts to expand the scope of the SFCL application in the power system. The power system operator should first determine the proper amount of current-limiting resistance (CLR) of the hybrid SFCL. Therefore, this paper suggests a decision scheme of the optimal insertion resistance in an SFCL application to reduce the transformer inrush current. This scheme and the SFCL model are implemented using the electromagnetic transient program (EMTP). We determine the optimal CLR by EMTP simulation, and this value is applied to model the SFCL by the EMTP. The simulation results show the validity and effectiveness of the suggested scheme and the ability of the SFCL to reduce the inrush current.
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - Information and Communication Engineering > School of Electronic and Electrical Engineering > 1. Journal Articles
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.