A dynamic scan chain reordering for low-power VLSI testing

Baek, C.-K.[Baek, C.-K.]; Kim, I.[Kim, I.]; Kim, J.-T.[Kim, J.-T.]; Kim, Y.-H.[Kim, Y.-H.]; Min, H.B.[Min, H.B.]; Lee, J.-H.[Lee, J.-H.]

doi:10.1109/ITCS.2010.5581280

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A dynamic scan chain reordering for low-power VLSI testing

Authors: Baek, C.-K.[Baek, C.-K.]; Kim, I.[Kim, I.]; Kim, J.-T.[Kim, J.-T.]; Kim, Y.-H.[Kim, Y.-H.]; Min, H.B.[Min, H.B.]; Lee, J.-H.[Lee, J.-H.]

Issue Date: 2010

Citation: 2010 2nd International Conference on Information Technology Convergence and Services, ITCS 2010

Journal Title: 2010 2nd International Conference on Information Technology Convergence and Services, ITCS 2010

URI: https://scholarworks.bwise.kr/skku/handle/2021.sw.skku/75985

DOI: 10.1109/ITCS.2010.5581280

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Appears in Collections: Information and Communication Engineering > Information and Communication Engineering > 1. Journal Articles; Information and Communication Engineering > School of Electronic and Electrical Engineering > 1. Journal Articles

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