Memory properties using nano-scale phase separation of HfO based dielectrics

Yingqian, W.[Yingqian, W.]; Gang, Z.[Gang, Z.]; Yoo, W[Yoo, W]

doi:10.1109/ICSICT.2006.306470

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Memory properties using nano-scale phase separation of HfO based dielectrics

Authors: Yingqian, W.[Yingqian, W.]; Gang, Z.[Gang, Z.]; Yoo, W[Yoo, W]

Issue Date: 2007

Citation: ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, Proceedings, pp.729 - 731

Journal Title: ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, Proceedings

Start Page: 729

End Page: 731

URI: https://scholarworks.bwise.kr/skku/handle/2021.sw.skku/85930

DOI: 10.1109/ICSICT.2006.306470

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Appears in Collections: SKKU Advanced Institute of Nano Technology > ETC > 1. Journal Articles

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