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Evaluation of shockproofness of small form factor mobile TFT-LCD

Authors
Kim, BS[Kim, Byung-Sun]Lee, DJ[Lee, Dock-Jin]Koo, JC[Koo, J. C.]Choi, JB[Choi, J. B.]Kim, YJ[Kim, Young-Jin]Lee, JN[Lee, Jong-Nam]Chu, YB[Chu, Young-Bee]
Issue Date
2006
Publisher
TRANS TECH PUBLICATIONS LTD
Keywords
TFT-LCD; impact tester; anti-shock performance; impact analysis
Citation
ADVANCED NONDESTRUCTUVE EVALUATION I, PTS 1 AND 2, PROCEEDINGS, v.321-323, pp.1679 - 1682
Indexed
SCIE
SCOPUS
Journal Title
ADVANCED NONDESTRUCTUVE EVALUATION I, PTS 1 AND 2, PROCEEDINGS
Volume
321-323
Start Page
1679
End Page
1682
URI
https://scholarworks.bwise.kr/skku/handle/2021.sw.skku/89112
ISSN
1013-9826
Abstract
As the TFT-LCDs are getting more attention for the next generation display device, specifications of the mechanical functionalities of the device is to be more tighter as well as the electrical user specifications. Due to its brittle characteristics of TFT-LCD panels, maintaining mechanical integrity under an impact loading situation is the one of the key design concerns. Furthermore, as the TFT-LCDs are popularly adopted for various mobile equipments such as cellular phones and digital cameras, shock failure of the display should be prohibitive for the design engineers. A major incident being monitored during the shock loading is of course the local material failure of the TFT-LCD panel that might happen at its maximum deformation. The present work delivers a systematic approach for the shockproof design of mobile TFT-LCD. A specially designed shock test setup evaluated by a set of rigorous FEM analyses is shown and comments for the shockproof method is to be also delineated.
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