Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Effects of H2 addition in magnetized inductively coupled C2F6 plasma etching of silica aerogel film

Authors
Wang S.-J.[Wang S.-J.]Park H.-H.[Park H.-H.]Hyun S.-H.[Hyun S.-H.]Yeom G.-Y.[Yeom G.-Y.]
Issue Date
2000
Citation
Digest of Papers - 2000 International Microprocesses and Nanotechnology Conference, MNC 2000, pp.206 - 207
Journal Title
Digest of Papers - 2000 International Microprocesses and Nanotechnology Conference, MNC 2000
Start Page
206
End Page
207
URI
https://scholarworks.bwise.kr/skku/handle/2021.sw.skku/89322
DOI
10.1109/IMNC.2000.872712
Abstract
Low k dielectrics not only lower line-to-line capacitance, but also reduce cross-talk noise in the interconnect and alleviate power dissipation issues. Silica aerogel film is a promising candidate for low-k innerlevel dielectrics by its ca. 70% porosity.1) As one of manufacture processes, etching behavior was considered with the increasing of H2 gas addition to C2F6 gas.
Files in This Item
There are no files associated with this item.
Appears in
Collections
Engineering > School of Advanced Materials Science and Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Altmetrics

Total Views & Downloads

BROWSE