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Novel driving methods of gate driver circuit for depletion mode oxide TFTs

Authors
Oh, J.[Oh, J.]Jung, K.-M.[Jung, K.-M.]Lee, S.-Y.[Lee, S.-Y.]Park, K.[Park, K.]Jeon, J.-H.[Jeon, J.-H.]Kim, Y.-S.[Kim, Y.-S.]
Issue Date
2019
Publisher
International Display Workshops
Keywords
Depletion mode; Gate driver circuit; Reliability; Thin-film transistor; Threshold voltage
Citation
Proceedings of the International Display Workshops, v.3, pp.1524 - 1526
Indexed
SCOPUS
Journal Title
Proceedings of the International Display Workshops
Volume
3
Start Page
1524
End Page
1526
URI
https://scholarworks.bwise.kr/skku/handle/2021.sw.skku/93955
ISSN
1883-2490
Abstract
We introduce novel driving methods of pull-down unit in a gate driver circuit for enhancement and depletion mode a-IGZO thin-film transistors (TFTs). Using 3T1C diode connection structure, our circuit can compensate for VTH of pull-down unit in the enhancement mode and can be normally operated in the depletion mode. © 2019 ITE and SID
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