Optical detection of charge accumulation in an electrically anisotropic semimetal of WTe2
- Authors
- Choi, YG[Choi, Young-Gwan]; Doan, MH[Manh-Ha Doan]; Choi, GM[Choi, Gyung-Min]
- Issue Date
- Aug-2022
- Publisher
- KOREAN PHYSICAL SOC
- Keywords
- Charge accumulation; Polarization rotation; Electro-optic effect; Tungsten ditelluride
- Citation
- JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.81, no.3, pp.267 - 272
- Indexed
- SCIE
SCOPUS
KCI
- Journal Title
- JOURNAL OF THE KOREAN PHYSICAL SOCIETY
- Volume
- 81
- Number
- 3
- Start Page
- 267
- End Page
- 272
- URI
- https://scholarworks.bwise.kr/skku/handle/2021.sw.skku/98563
- DOI
- 10.1007/s40042-022-00539-2
- ISSN
- 0374-4884
- Abstract
- Charge accumulation in a current-injected device provides important information about the electrical properties of materials. Conventionally, local charge accumulation is measured by potential drops at multiple positions in the device using a voltage probe. Here, we report on direct observations of the spatial distribution of charge accumulation in semimetal WTe2 via the polarization rotation microscopy technique. The mappings of the polarization rotation of the reflected light show that the injected charge carriers accumulate near the transverse boundaries of the device. Our results demonstrate an optical method to visualize charge accumulation profiles of the electrically anisotropic medium.
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Collections - Graduate School > Energy Science > 1. Journal Articles
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