Kim, E[Kim, Eungsu]; Euh, Y[Euh, Yoonje]; Yoo, J[Yoo, Jongsu]; Lee, JG[Lee, Jae-gil]; Jo, Y[Jo, Yuri]; Lee, D[Lee, Daeho]
ArticleIssue Date2021CitationTECHNOLOGY ANALYSIS & STRATEGIC MANAGEMENT, v.33, no.7, pp.843 - 856PublisherROUTLEDGE JOURNALS, TAYLOR & FRANCIS LTD