Kim, J.; Baek, D.; Ding, C.; Lin, S.; Shin, D.; Lin, X.; Wang, Y.; Cho, Y.H.; Park, S.H.; Chang, N.
ArticleIssue Date2018CitationIEEE Transactions on Very Large Scale Integration (VLSI) Systems, v.26, no.7, pp.1241 - 1253PublisherInstitute of Electrical and Electronics Engineers Inc.