Yoo, W.J.; Jeon, D.Y.; Seo, J.K.; Shin, S.H.; Han, K.-T.; Hong, S.H.; Kim, S.G.; Sim, H.I.; Cho, S.H.; Lee, B.S.
ConferenceIssue Date2013Citation2013 3rd International Conference on Advanced Measurement and Test, AMT 2013, v.718-720, pp.576 - 579ISBN9783037857168PlaceXiamen