The electrical characterization and relaxation behavior of Ag(Ta0.8Nb0.2)O3 ceramics
DC Field | Value | Language |
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dc.contributor.author | Kim, Y.-S. | - |
dc.contributor.author | Kim, J.-C. | - |
dc.contributor.author | Jeong, T.-H. | - |
dc.contributor.author | Nam, S.-P. | - |
dc.contributor.author | Lee, S.-H. | - |
dc.contributor.author | Kim, H.-K. | - |
dc.contributor.author | Lee, K.-T. | - |
dc.date.available | 2018-05-09T13:32:20Z | - |
dc.date.created | 2018-04-17 | - |
dc.date.issued | 2014 | - |
dc.identifier.issn | 1229-7607 | - |
dc.identifier.uri | http://scholarworks.bwise.kr/ssu/handle/2018.sw.ssu/10900 | - |
dc.description.abstract | Ag(Ta,Nb)O3 materials have a perovskite structure with a low loss tangent. These materials have been widely researched for their applications as high-frequency, passive components. Also, Ag(Ta,Nb)O3 materials have weak frequency dispersion with high dielectric permittivity which gives them enormous potential for use in electronic components, including the filters, and embedded capacitors. Therefore, our research will discuss the structural and electrical relaxation properties of Ag(Ta0.8Nb0.2)O3 ceramics for device applications. We will investigate using X-ray diffraction to understand their structural properties and will analyze voltage dependent leakage current and timedependent relaxation behavior to understand their material properties. © 2014 KIEEME. All rights reserved. | - |
dc.publisher | Korean Institute of Electrical and Electronic Material Engineers | - |
dc.relation.isPartOf | Transactions on Electrical and Electronic Materials | - |
dc.subject | Ceramic materials | - |
dc.subject | Dispersions | - |
dc.subject | Electric properties | - |
dc.subject | Permittivity | - |
dc.subject | Structural ceramics | - |
dc.subject | X ray diffraction | - |
dc.subject | Ceramics | - |
dc.subject | Electrical characterization | - |
dc.subject | Electrical relaxations | - |
dc.subject | Electronic component | - |
dc.subject | Frequency dispersion | - |
dc.subject | Perovskite structures | - |
dc.subject | Relaxation behaviors | - |
dc.subject | XRD | - |
dc.subject | Silver | - |
dc.title | The electrical characterization and relaxation behavior of Ag(Ta0.8Nb0.2)O3 ceramics | - |
dc.type | Article | - |
dc.identifier.doi | 10.4313/TEEM.2014.15.2.100 | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | Transactions on Electrical and Electronic Materials, v.15, no.2, pp.100 - 102 | - |
dc.identifier.kciid | ART001868697 | - |
dc.description.journalClass | 1 | - |
dc.identifier.scopusid | 2-s2.0-84898469656 | - |
dc.citation.endPage | 102 | - |
dc.citation.number | 2 | - |
dc.citation.startPage | 100 | - |
dc.citation.title | Transactions on Electrical and Electronic Materials | - |
dc.citation.volume | 15 | - |
dc.contributor.affiliatedAuthor | Kim, J.-C. | - |
dc.type.docType | Article | - |
dc.description.oadoiVersion | published | - |
dc.subject.keywordAuthor | Ceramics | - |
dc.subject.keywordAuthor | Relaxation current | - |
dc.subject.keywordAuthor | XRD | - |
dc.description.journalRegisteredClass | scopus | - |
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