Enhancing crystallinity of C-60 layer by thickness-control of underneath pentacene layer for high mobility C-60/pentacene ambipolar transistors
- Authors
- Ahn, Kwangseok; Kim, Jong Beom; Park, Hyunjun; Kim, Hyunjung; Lee, Moo Hyung; Kim, Beom Joon; Cho, Jeong Ho; Kang, Moon Sung; Lee, Dong Ryeol
- Issue Date
- 28-Jan-2013
- Publisher
- AMER INST PHYSICS
- Citation
- APPLIED PHYSICS LETTERS, v.102, no.4
- Journal Title
- APPLIED PHYSICS LETTERS
- Volume
- 102
- Number
- 4
- URI
- http://scholarworks.bwise.kr/ssu/handle/2018.sw.ssu/11370
- DOI
- 10.1063/1.4789873
- ISSN
- 0003-6951
- Abstract
- We present systematic control of the crystallinity and electrical transport properties of C-60 films that are deposited onto pentacene layers, based on simple tuning of the underneath pentacene layer thickness. With increasing the pentacene layer thickness from 0 to 2 monolayers, we observed improvement in crystallinity and grain size of the C-60 layer, which led to dramatic enhancement in electron conduction. Also, hole transport in this bilayer structure could be generated when the thickness of the pentacene layer was above one monolayer. The resulting ambipolar transport thin-film transistors yielded electron and hole mobilities as high as 2.8 and 0.3 cm(2) V-1 s(-1), respectively, and complementary inverters with gain value above 20. (C) 2013 American Institute of Physics. [http://dx.doi.org.access.yonsei.ac.kr:8080/10.1063/1.4789873]
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- Appears in
Collections - College of Natural Sciences > Department of Physics > 1. Journal Articles
- College of Engineering > Department of Chemical Engineering > 1. Journal Articles
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