Optimal test capacity allocation in automated high-frequency testing environments

Abstract

This paper discusses characteristics unique in the two-phase high-frequency-testing (HFT) environment in semiconductor manufacturing. We believe this paper is the first to define, formalize, and analyze the decision making problem associated with the two-phase HFT. Specifically, this paper defines the problem of minimizing the total HFT capacity usage by systematically finding the optimal number of preliminary HFT bin-1 chips subject to the main HFT, with the existence of the target service rate. We also propose a heuristic algorithm that exploits the special structure of the problem for efficiently obtaining a near-optimal solution. Finally, a numerical analysis and a case study have been conducted to gain more insights on the problem structure and the proposed algorithm.