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Cited 3 time in webofscience Cited 3 time in scopus
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A closed-loop IGBT non-destructive tester

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dc.contributor.authorAhmed, A.-
dc.contributor.authorShadrokh, Y.-
dc.contributor.authorCoulbeck, L.-
dc.contributor.authorCastellazzi, A.-
dc.contributor.authorJohnson, C. M.-
dc.date.available2018-05-10T05:07:52Z-
dc.date.created2018-04-17-
dc.date.issued2012-09-
dc.identifier.issn0026-2714-
dc.identifier.urihttp://scholarworks.bwise.kr/ssu/handle/2018.sw.ssu/12356-
dc.description.abstractNon-destructive testing capability is a very important aspect of power device technology evolution towards more robust and reliable products. This paper proposes a closed-loop non-destructive tester for high power multi-chip IGBT modules. Other than proposed elsewhere in the past, the solution put forward here includes the possibility to be used in closed-loop, by proper identification and monitoring of representative pre-failure signatures to automatically trigger the activation of a protective switch and prevent the failure of the device under test. The advantage is that devices of different characteristics (e.g., voltage range, type) can be tested without having to set a specific intervention delay for the protection circuit. (C) 2012 Elsevier Ltd. All rights reserved.-
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD-
dc.relation.isPartOfMICROELECTRONICS RELIABILITY-
dc.subjectDYNAMICS-
dc.titleA closed-loop IGBT non-destructive tester-
dc.typeArticle-
dc.identifier.doi10.1016/j.microrel.2012.06.108-
dc.type.rimsART-
dc.identifier.bibliographicCitationMICROELECTRONICS RELIABILITY, v.52, no.9-10, pp.2358 - 2362-
dc.description.journalClass1-
dc.identifier.wosid000309785400118-
dc.identifier.scopusid2-s2.0-84866740402-
dc.citation.endPage2362-
dc.citation.number9-10-
dc.citation.startPage2358-
dc.citation.titleMICROELECTRONICS RELIABILITY-
dc.citation.volume52-
dc.contributor.affiliatedAuthorAhmed, A.-
dc.type.docTypeArticle; Proceedings Paper-
dc.subject.keywordPlusDYNAMICS-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
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