A closed-loop IGBT non-destructive tester
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Ahmed, A. | - |
dc.contributor.author | Shadrokh, Y. | - |
dc.contributor.author | Coulbeck, L. | - |
dc.contributor.author | Castellazzi, A. | - |
dc.contributor.author | Johnson, C. M. | - |
dc.date.available | 2018-05-10T05:07:52Z | - |
dc.date.created | 2018-04-17 | - |
dc.date.issued | 2012-09 | - |
dc.identifier.issn | 0026-2714 | - |
dc.identifier.uri | http://scholarworks.bwise.kr/ssu/handle/2018.sw.ssu/12356 | - |
dc.description.abstract | Non-destructive testing capability is a very important aspect of power device technology evolution towards more robust and reliable products. This paper proposes a closed-loop non-destructive tester for high power multi-chip IGBT modules. Other than proposed elsewhere in the past, the solution put forward here includes the possibility to be used in closed-loop, by proper identification and monitoring of representative pre-failure signatures to automatically trigger the activation of a protective switch and prevent the failure of the device under test. The advantage is that devices of different characteristics (e.g., voltage range, type) can be tested without having to set a specific intervention delay for the protection circuit. (C) 2012 Elsevier Ltd. All rights reserved. | - |
dc.publisher | PERGAMON-ELSEVIER SCIENCE LTD | - |
dc.relation.isPartOf | MICROELECTRONICS RELIABILITY | - |
dc.subject | DYNAMICS | - |
dc.title | A closed-loop IGBT non-destructive tester | - |
dc.type | Article | - |
dc.identifier.doi | 10.1016/j.microrel.2012.06.108 | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | MICROELECTRONICS RELIABILITY, v.52, no.9-10, pp.2358 - 2362 | - |
dc.description.journalClass | 1 | - |
dc.identifier.wosid | 000309785400118 | - |
dc.identifier.scopusid | 2-s2.0-84866740402 | - |
dc.citation.endPage | 2362 | - |
dc.citation.number | 9-10 | - |
dc.citation.startPage | 2358 | - |
dc.citation.title | MICROELECTRONICS RELIABILITY | - |
dc.citation.volume | 52 | - |
dc.contributor.affiliatedAuthor | Ahmed, A. | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.subject.keywordPlus | DYNAMICS | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
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