Simulation of electron density profile reconstruction on KSTAR using wavelet analysis
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Roh, Youngsu | - |
dc.date.available | 2018-05-10T16:33:23Z | - |
dc.date.created | 2018-04-17 | - |
dc.date.issued | 2007-12 | - |
dc.identifier.issn | 0021-4922 | - |
dc.identifier.uri | http://scholarworks.bwise.kr/ssu/handle/2018.sw.ssu/17720 | - |
dc.description.abstract | The wavelet analysis is utilized to directly extract an instantaneous beat frequency from the raw mixer intermediate frequency (IF) signals of the Korea Superconducting Tokamak Advanced Research (KSTAR) reflectometry system, thereby providing the group delays for the measurement of electron density profiles. Since the KSTAR reflectometer signals are not currently available, raw mixer IF signals are generated using assumed density profiles and the X-mode dispersion relation on the basis of the envisioned KSTAR parameters. In order to examine the reconstruction performance of the wavelet analysis under various conditions, two types of density profiles and noise effects on IF signals are considered. | - |
dc.publisher | INST PURE APPLIED PHYSICS | - |
dc.relation.isPartOf | JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | - |
dc.subject | MICROWAVE REFLECTOMETRY | - |
dc.subject | PLASMAS | - |
dc.subject | TOKAMAK | - |
dc.title | Simulation of electron density profile reconstruction on KSTAR using wavelet analysis | - |
dc.type | Article | - |
dc.identifier.doi | 10.1143/JJAP.46.L1146 | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, v.46, no.45-49, pp.L1146 - L1148 | - |
dc.description.journalClass | 1 | - |
dc.identifier.wosid | 000252043500021 | - |
dc.identifier.scopusid | 2-s2.0-54249118242 | - |
dc.citation.endPage | L1148 | - |
dc.citation.number | 45-49 | - |
dc.citation.startPage | L1146 | - |
dc.citation.title | JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | - |
dc.citation.volume | 46 | - |
dc.contributor.affiliatedAuthor | Roh, Youngsu | - |
dc.type.docType | Article | - |
dc.subject.keywordAuthor | reflectometry | - |
dc.subject.keywordAuthor | KSTAR | - |
dc.subject.keywordAuthor | beat frequency | - |
dc.subject.keywordAuthor | density profile reconstruction | - |
dc.subject.keywordAuthor | wavelet analysis | - |
dc.subject.keywordPlus | MICROWAVE REFLECTOMETRY | - |
dc.subject.keywordPlus | PLASMAS | - |
dc.subject.keywordPlus | TOKAMAK | - |
dc.description.journalRegisteredClass | scopus | - |
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