A study on methodology for enhancing reliability of datapath

Abstract

In this paper, an efficient non-scan DFT(Design For Testability) method described in RTL for datapath is proposed. The proposed non-scan DFT method improves testability of datapath based on hierarchical testability analysis regardless of the datapath width. It always guarantees higher fault efficiency and little hardware overhead than previous methods. The experimental results show that the proposed method has superior abilities of test application time and area overhead compared to the scan method.