A study on insuring the full reliability of finite state machine
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Yang, S | - |
dc.contributor.author | Kim, MJ | - |
dc.contributor.author | Park, JH | - |
dc.contributor.author | Chang, H | - |
dc.date.available | 2018-05-10T18:48:21Z | - |
dc.date.created | 2018-04-17 | - |
dc.date.issued | 2003 | - |
dc.identifier.issn | 0302-9743 | - |
dc.identifier.uri | http://scholarworks.bwise.kr/ssu/handle/2018.sw.ssu/21117 | - |
dc.description.abstract | In this paper, an efficient non-scan design-for-testability (DFT) method for finite state machine(FSM) is proposed. The proposed method always guarantees short test pattern generation time and complete fault efficiency. It has a lower area overhead than full-scan and other non-scan DFT methods and enables to apply test patterns at-speed. The efficiency of the proposed method is demonstrated using well-known MCNC'91 FSM benchmark circuits. | - |
dc.publisher | SPRINGER-VERLAG BERLIN | - |
dc.relation.isPartOf | COMPUTATIONAL SCIENCE AND ITS APPLICATIONS - ICCSA 2003, PT 2, PROCEEDINGS | - |
dc.title | A study on insuring the full reliability of finite state machine | - |
dc.type | Article | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | COMPUTATIONAL SCIENCE AND ITS APPLICATIONS - ICCSA 2003, PT 2, PROCEEDINGS, v.2668, pp.656 - 663 | - |
dc.description.journalClass | 1 | - |
dc.identifier.wosid | 000184327300072 | - |
dc.identifier.scopusid | 2-s2.0-35248844118 | - |
dc.citation.endPage | 663 | - |
dc.citation.startPage | 656 | - |
dc.citation.title | COMPUTATIONAL SCIENCE AND ITS APPLICATIONS - ICCSA 2003, PT 2, PROCEEDINGS | - |
dc.citation.volume | 2668 | - |
dc.contributor.affiliatedAuthor | Chang, H | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.description.journalRegisteredClass | scopus | - |
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