Park, Jung-Hwan; Manoharan, Mohana Sundar; Lee, Chun-Gu; Tawfik, Mohamed Atef; Kim, Kyoung-Tak; Ahmed, Ashraf; Park, Joung-Hu
ArticleIssue Date2022CitationIEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, v.22, no.1, pp.19 - 25PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC