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Electrical Characterization of the through Via in Package-on-Package with Interposer using Parameter Extraction Method

Authors
위재경
Issue Date
May-2010
Publisher
Journal of Measurement Science and Instrumentation
Citation
Journal of Measurement Science and Instrumentation
URI
http://scholarworks.bwise.kr/ssu/handle/2018.sw.ssu/27616
Conference Name
Journal of Measurement Science and Instrumentation
Place
CN
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College of Information Technology > ETC > 2. Conference Papers

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