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웨이블릿 다해상도 분석에 의한 디지털 이미지 결점 검출 알고리듬
- Authors
- 김주용
- Issue Date
- Apr-2008
- Publisher
- 한국섬유공학회
- Citation
- 한국 섬유공학회 학술발표회
- Conference Name
- 한국 섬유공학회 학술발표회
- Place
- KO
한양대학교 한양종합기술원
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Related Researcher
- Kim, Joo yong
- College of Engineering (Department of Materials Science and Engineering)