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A model for measuring the r&d projects similarity using patent information

Authors
Kim, J.-B.Byun, J.-W.
Issue Date
May-2014
Publisher
IEEE Computer Society
Citation
5th International Conference on Information Science and Applications, ICISA 2014
URI
http://scholarworks.bwise.kr/ssu/handle/2018.sw.ssu/32696
DOI
10.1109/ICISA.2014.6847333
Conference Name
5th International Conference on Information Science and Applications, ICISA 2014
Place
US
Seoul
Conference Date
2014-05-06
ISBN
9781479944439
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