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Analysis of EMI dependence on signal duty and supplied voltage

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dc.contributor.authorLee, P.-
dc.contributor.authorWee, J.-K.-
dc.contributor.authorLee, K.-Y.-
dc.contributor.authorSong, I.-
dc.contributor.authorKim, B.-G.-
dc.date.available2019-04-10T11:02:29Z-
dc.date.created2018-04-17-
dc.date.issued2009-
dc.identifier.isbn9781424444892-
dc.identifier.urihttp://scholarworks.bwise.kr/ssu/handle/2018.sw.ssu/33406-
dc.description.abstractIn this paper, we analyzed EMI dependence on signal duty ratio and power supplied voltage. The EMI levels of the chip-mounted modules were tested and the near-field and farfield emission levels were measured at 800 MHz frequency (the 2nd harmonic of the clock). The relation between EMI levels and line spectra of signals was analyzed for chip design quality, especially including clock generation circuitry and data paths. In addition, voltage-scaling operation and slew rate control operation which affect radiated emission levels, were tested to investigate the effect of duty ratio and slew asymmetry on EMI generation. ©2009 IEEE.-
dc.relation.isPartOf2009 IEEE Workshop on Signal Propagation on Interconnects, SPI '09-
dc.titleAnalysis of EMI dependence on signal duty and supplied voltage-
dc.typeConference-
dc.identifier.doi10.1109/SPI.2009.5089869-
dc.type.rimsCONF-
dc.identifier.bibliographicCitation2009 IEEE Workshop on Signal Propagation on Interconnects, SPI '09-
dc.description.journalClass2-
dc.identifier.scopusid2-s2.0-70349986925-
dc.citation.conferenceDate2009-05-12-
dc.citation.conferencePlaceStrasbourg-
dc.citation.title2009 IEEE Workshop on Signal Propagation on Interconnects, SPI '09-
dc.contributor.affiliatedAuthorWee, J.-K.-
dc.contributor.affiliatedAuthorSong, I.-
dc.contributor.affiliatedAuthorKim, B.-G.-
dc.type.docTypeConference Paper-
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