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ECSD: Enhanced Compromised Switch Detection in an SDN-Based Cloud through Multivariate Time-Series Analysis

Authors
Dinh, P.T.Park, M.
Issue Date
Jun-2020
Publisher
Institute of Electrical and Electronics Engineers Inc.
Keywords
anomaly detection; distributed cloud computing; machine learning; network function virtualization; Network security; SDN compromised switch; software defined networking
Citation
IEEE Access, v.8, pp.119346 - 119360
Journal Title
IEEE Access
Volume
8
Start Page
119346
End Page
119360
URI
http://scholarworks.bwise.kr/ssu/handle/2018.sw.ssu/38604
DOI
10.1109/ACCESS.2020.3004258
ISSN
2169-3536
Abstract
Nowadays, Software-Defined Networks (SDNs) are increasingly being used in many practical settings, posing a variety of security risks, such as compromised switches. Once a switch is compromised by an attacker, the switch may be either malfunctioning or misconfigured, displaying some abnormal network behaviors, e.g., delaying, dropping, adding, or modifying the traffic. In our previous work, we proposed an efficient scheme for detecting compromised SDN switches based on chaotic analysis of network traffic using an autoregressive-integrated-moving-average model. This scheme showed good results overall; however, it still showed high false-alarm rates due to a hard-set threshold. In this paper, we propose an enhanced scheme to detect compromised SDN switches effectively and reliably. The scheme consists of two phases (online and offline), leveraging the advantages of a stochastic recurrent neural network variant of multivariate time-series-based anomaly detection. Our main idea is to capture the normal patterns of multivariate time series by learning strong representations with the key techniques, such as planar normalizing flow and stochastic variable connection, then reconstruct input data by the representations, and use the reconstruction probabilities to find anomalies. Evaluation results of our proposed scheme yield outstanding performance in comparison with our previous work and other solutions. © 2013 IEEE.
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