Simplified small exponent test for batch verification
- Authors
- Hwang, Jung Yeon; Song, Boyeon; Choi, Daeseon; Jin, Seung-Hun; Cho, Hyun Sook; Lee, Mun-Kyu
- Issue Date
- Feb-2017
- Publisher
- ELSEVIER
- Keywords
- Batch verification; Exponentiation; Small exponent test; Digital signature
- Citation
- THEORETICAL COMPUTER SCIENCE, v.662, pp.48 - 58
- Journal Title
- THEORETICAL COMPUTER SCIENCE
- Volume
- 662
- Start Page
- 48
- End Page
- 58
- URI
- http://scholarworks.bwise.kr/ssu/handle/2018.sw.ssu/39727
- DOI
- 10.1016/j.tcs.2016.12.017
- ISSN
- 0304-3975
- Abstract
- The Small Exponent Test (SET) for exponentiation is an essential batch-verification technique that is widely applied. In this paper, we propose a simplified SET that can securely batch-verify n instances with only n-1 randomizing exponents. We show that the structure of the proposed batch test is compact in the sense that it works with a minimal number of randomizing exponents for the SET. Thus, our test offers various advantages. Overall, compared to the original SET, the proposed simplified SET is more efficient for any sized batch instance. In particular, unlike the SET, our proposal performs well even when the size of a batch instance is small, e.g., n =1, 2, 3, and 4. This feature can be also used to significantly reduce pairing computations in a signature scheme where several pairing equations are verified. In addition, our test can be combined easily and generically with existing batch techniques such as the use of sparse exponents, the bucket test for large batch sizes, or an automated tool to generate a batch algorithm. Finally, with our simplified test, an efficient identification algorithm can be constructed to discover incorrect instances in a batch. (C) 2016 Elsevier B.V. All rights reserved.
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