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Simplified small exponent test for batch verification

Authors
Hwang, Jung YeonSong, BoyeonChoi, DaeseonJin, Seung-HunCho, Hyun SookLee, Mun-Kyu
Issue Date
Feb-2017
Publisher
ELSEVIER
Keywords
Batch verification; Exponentiation; Small exponent test; Digital signature
Citation
THEORETICAL COMPUTER SCIENCE, v.662, pp.48 - 58
Journal Title
THEORETICAL COMPUTER SCIENCE
Volume
662
Start Page
48
End Page
58
URI
http://scholarworks.bwise.kr/ssu/handle/2018.sw.ssu/39727
DOI
10.1016/j.tcs.2016.12.017
ISSN
0304-3975
Abstract
The Small Exponent Test (SET) for exponentiation is an essential batch-verification technique that is widely applied. In this paper, we propose a simplified SET that can securely batch-verify n instances with only n-1 randomizing exponents. We show that the structure of the proposed batch test is compact in the sense that it works with a minimal number of randomizing exponents for the SET. Thus, our test offers various advantages. Overall, compared to the original SET, the proposed simplified SET is more efficient for any sized batch instance. In particular, unlike the SET, our proposal performs well even when the size of a batch instance is small, e.g., n =1, 2, 3, and 4. This feature can be also used to significantly reduce pairing computations in a signature scheme where several pairing equations are verified. In addition, our test can be combined easily and generically with existing batch techniques such as the use of sparse exponents, the bucket test for large batch sizes, or an automated tool to generate a batch algorithm. Finally, with our simplified test, an efficient identification algorithm can be constructed to discover incorrect instances in a batch. (C) 2016 Elsevier B.V. All rights reserved.
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