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Ferroelectric alpha-In2Se3 Wrapped-Gate beta-Ga2O3 Field-Effect Transistors for Dynamic Threshold Voltage Control

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dc.contributor.authorYang, Jeong Yong-
dc.contributor.authorYeom, Min Jae-
dc.contributor.authorPark, Youngseo-
dc.contributor.authorHeo, Junseok-
dc.contributor.authorYoo, Geonwook-
dc.date.accessioned2021-09-23T02:40:10Z-
dc.date.available2021-09-23T02:40:10Z-
dc.date.created2021-09-09-
dc.date.issued2021-08-
dc.identifier.issn2199-160X-
dc.identifier.urihttp://scholarworks.bwise.kr/ssu/handle/2018.sw.ssu/41227-
dc.description.abstractIndium selenide (alpha-In2Se3), which is a recently emerging ferroelectric semiconductor, can solve a major hindrance to applications of an ultra-wide bandgap beta-gallium oxide (beta-Ga2O3) semiconductor. Here, ferroelectric alpha-In2Se3 wrapped-gate beta-Ga2O3 field-effect transistors (FETs) for dynamic threshold voltage (V-TH) control is demonstrated. The dry-transferred alpha-In2Se3 layer is wrapped around beta-Ga2O3 channel, which allows efficient electrostatic gate modulation. Thus, the ferroelectricity of alpha-In2Se3 and a thin native oxide interlayer formed at the interface between beta-Ga2O3 and alpha-In2Se3 can provide effective V-TH control. Applying a positive voltage pulse to the gate electrode induces positive V-TH shift; hence, the device can be even changed from depletion to enhancement (E-) mode. The E-mode beta-Ga2O3 FET exhibits steep-subthreshold slope with a negligible hysteresis. The V-TH of E-mode can be further modulated by applying back-gate bias, and electrical performance can be enhanced via dual-gate operation. The approach demonstrates an energy efficient beta-Ga2O3-based switching device architecture integrated with ferroelectric van der Waals 2D materials.-
dc.language영어-
dc.language.isoen-
dc.publisherWILEY-
dc.relation.isPartOfADVANCED ELECTRONIC MATERIALS-
dc.titleFerroelectric alpha-In2Se3 Wrapped-Gate beta-Ga2O3 Field-Effect Transistors for Dynamic Threshold Voltage Control-
dc.typeArticle-
dc.identifier.doi10.1002/aelm.202100306-
dc.type.rimsART-
dc.identifier.bibliographicCitationADVANCED ELECTRONIC MATERIALS, v.7, no.8-
dc.description.journalClass1-
dc.identifier.wosid000654890100001-
dc.identifier.scopusid2-s2.0-85106474957-
dc.citation.number8-
dc.citation.titleADVANCED ELECTRONIC MATERIALS-
dc.citation.volume7-
dc.contributor.affiliatedAuthorYoo, Geonwook-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.subject.keywordAuthorbeta&amp-
dc.subject.keywordAuthor#8208-
dc.subject.keywordAuthorgallium oxide-
dc.subject.keywordAuthorferroelectric-
dc.subject.keywordAuthorindium selenide-
dc.subject.keywordAuthorthreshold voltage control-
dc.subject.keywordAuthorwrapped&amp-
dc.subject.keywordAuthor#8208-
dc.subject.keywordAuthorgate structure-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
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