X-ray reflectivity data analysis using Bayesian inference: The study of induced Pt magnetization in Pt/Co/PtX-ray reflectivity data analysis using Bayesian inference: The study of induced Pt magnetization in Pt/Co/Pt
- Other Titles
- X-ray reflectivity data analysis using Bayesian inference: The study of induced Pt magnetization in Pt/Co/Pt
- Authors
- 김국태; 김동옥; 기정연; 서일완; 최영성; 최준우; 이동렬
- Issue Date
- Oct-2021
- Publisher
- 한국물리학회
- Keywords
- Bayesian analysis Resonant x-ray reflectivity X-ray resonant magnetic reflectivity Magnetic proximity effect
- Citation
- Current Applied Physics, v.30, pp.46 - 52
- Journal Title
- Current Applied Physics
- Volume
- 30
- Start Page
- 46
- End Page
- 52
- URI
- http://scholarworks.bwise.kr/ssu/handle/2018.sw.ssu/41460
- DOI
- 10.1016/j.cap.2021.04.025
- ISSN
- 1567-1739
- Abstract
- The induced Pt magnetization in a Pt/Co/Pt thin film structure is studied. The normally nonmagnetic Pt acquires a magnetic moment due to the magnetic proximity effect at the Co–Pt interfaces. Element specific Pt structural and magnetic properties are characterized by synchrotron-based resonant x-ray reflectivity and x-ray resonant magnetic reflectivity measurements. An advanced analysis method based on Bayesian inference is used for model fitting of the x-ray data. Using this method, we retrieve the best fit values of material parameters (e.g., thickness, interfacial roughness) from the data. Analysis of x-ray reflectivity data of this specific system shows that the Pt magnetization and Co–Pt interfacial roughness is significantly different between the top and bottom Pt layers, with both values being larger in the top Pt. The successful application of this Bayesian method to study the magnetic and structural properties of a thin film system demonstrates its effectiveness for x-ray reflectivity data analysis.
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