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Cephalometric landmark detection via global and local encoders and patch-wise attentions

Authors
Lee, MinkyungChung, MinyoungShin, Yeong-Gil
Issue Date
22-Jan-2022
Publisher
ELSEVIER
Keywords
Auxiliary decoder networks; Cephalometric landmark detection; Direct point regression; Explicit global and local feature fusion; Patch-wise attention
Citation
NEUROCOMPUTING, v.470, pp.182 - 189
Journal Title
NEUROCOMPUTING
Volume
470
Start Page
182
End Page
189
URI
http://scholarworks.bwise.kr/ssu/handle/2018.sw.ssu/42044
DOI
10.1016/j.neucom.2021.11.003
ISSN
0925-2312
Abstract
Cephalometric landmark detection performs an important role in a diagnostic measurements for orthodontic treatment plans. As manual depiction of landmarks is a time-consuming and tedious task, the development of an automated detection algorithm for daily clinics is in high demand. In this study, we propose a single-passing convolutional neural network that performs an accurate landmark detection in a hierarchical fashion. The proposed network first extracts global contexts by regressing initial positions of all the landmarks. Subsequently, local features are extracted from landmark-centered patches, which are obtained through global regression. The encoded global and local features are concatenated and weighed through a novel patch-wise attention module to weigh the relative importance. The experimental results demonstrate that our proposed local patch-wise attention mechanism performs a significant role in accurate detection. The proposed method outperformed other state-of-the-art methods by improving the successful detection rate by approximately 1 ti 2%. The proposed method suggests that a structured attention, which is developed in a patch-wise fashion, significantly enhances the local feature encoders to further improve the final accuracy. (c) 2021 Elsevier B.V. All rights reserved.
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