Detailed Information
Cited 8 time in 
Cited 11 time in 
Cited 11 time in
Metadata Downloads
Effects of carbon contaminations on Y2O3-stabilized ZrO2 thin film electrolyte prepared by atomic layer deposition for thin film solid oxide fuel cells
- Issue Date
- Jun-2016
- Publisher
- ELSEVIER SCIENCE BV
- Citation
- CIRP ANNALS-MANUFACTURING TECHNOLOGY, v.65, no.1, pp.515 - 518
- Journal Title
- CIRP ANNALS-MANUFACTURING TECHNOLOGY
- Volume
- 65
- Number
- 1
- Start Page
- 515
- End Page
- 518
- ISSN
- 0007-8506
- Abstract
- In this study, influence of carbon impurities on characteristics of ALD-YSZ films is systematically investigated. Carbon concentration in ALD-YSZ films was controlled by changing Y2O3 ratio in YSZ super cycle. To examine electrochemical characteristics of ALD-YSZ films, nano-porous templates based thin film solid oxide fuel cells (TF-SOFCs) were fabricated with ALD-YSZ thin film electrolyte and examined at 500 degrees C. Open circuit voltages (OCVs) of TF-SOFCs with ALD-YSZ were clearly dependent on carbon contaminations. High carbon concentration caused leakage current through internal short circuit, and then, OCVs of TF-SOFCs were decreased. Post-processing of ALD-YSZ thin film electrolyte improved OCVs of TF-SOFCs. (C) 2016 CIRP.
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - College of Engineering > ETC > 1. Journal Articles
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
Related Researcher
- Park, Taehyun
- College of Engineering (School of Mechanical Engineering)