Detailed Information

Cited 14 time in webofscience Cited 16 time in scopus
Metadata Downloads

High Resolution a-IGZO TFT Pixel Circuit for Compensating Threshold Voltage Shifts and OLED Degradations

Authors
Kim, DaejungKim, YongchanLee, SuwonKang, Moon SungKim, Do HwanLee, Hojin
Issue Date
Sep-2017
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Keywords
Active-matrix organic light-emitting display (AMOLED); pixel circuit; amorphous-indium-gallium-zinc-oxide TFT (a-IGZO TFT); compensation; high aperture ratio
Citation
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, v.5, no.5, pp.372 - 377
Journal Title
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY
Volume
5
Number
5
Start Page
372
End Page
377
URI
http://scholarworks.bwise.kr/ssu/handle/2018.sw.ssu/6257
DOI
10.1109/JEDS.2017.2716368
ISSN
2168-6734
Abstract
In this paper, we propose a novel voltage programmed pixel circuit based on amorphous-indium-gallium-zinc-oxide thin-film transistors (a-IGZO TFTs) for active-matrix organic light-emitting displays. Through the extensive simulation work based on a-IGZO TFT and OLED models, we confirm that the proposed pixel circuit can compensate for threshold voltage variations of TFTs and OLED degradation over wide dynamic range (similar to 10(4)) of OLED current as well as achieve a high pixel aperture ratio with the suppressed OLED current error rate below 9%.
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Information Technology > ETC > 1. Journal Articles
College of Engineering > Department of Organic Materials and Fiber Engineering > 1. Journal Articles
College of Engineering > Department of Chemical Engineering > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Lee, Ho jin photo

Lee, Ho jin
College of Information Technology (Department of Electronic Engineering)
Read more

Altmetrics

Total Views & Downloads

BROWSE