Optimal testing strategy in semiconductor testing process
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Ko, Sung-Seok | - |
dc.contributor.author | Han, Yong-Hee | - |
dc.date.available | 2018-05-09T07:34:47Z | - |
dc.date.created | 2018-04-17 | - |
dc.date.issued | 2015-06 | - |
dc.identifier.issn | 0268-3768 | - |
dc.identifier.uri | http://scholarworks.bwise.kr/ssu/handle/2018.sw.ssu/8712 | - |
dc.description.abstract | We present an optimal test resource allocation strategy using uncertainty reduction in an environment where resource capacity changes dynamically according to engineering activity. The dynamics of test capacity change are modeled using a linear programming model and then extended and generalized to a Markov decision process. We analyze the model to develop structural results and illustrate its behavior with numerical examples. To the best of our knowledge, this model is the first to define, formalize, and analyze the decision-making process associated with reducing final test time in an environment where capacity may be dynamically increased, depending on engineering activity results. | - |
dc.publisher | SPRINGER LONDON LTD | - |
dc.relation.isPartOf | INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY | - |
dc.subject | PRODUCTION RAMP-UP | - |
dc.subject | PROCESS IMPROVEMENT | - |
dc.subject | QUALITY | - |
dc.title | Optimal testing strategy in semiconductor testing process | - |
dc.type | Article | - |
dc.identifier.doi | 10.1007/s00170-015-6783-1 | - |
dc.type.rims | ART | - |
dc.identifier.bibliographicCitation | INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, v.78, no.9-12, pp.2107 - 2117 | - |
dc.description.journalClass | 1 | - |
dc.identifier.wosid | 000354629200060 | - |
dc.identifier.scopusid | 2-s2.0-84939974724 | - |
dc.citation.endPage | 2117 | - |
dc.citation.number | 9-12 | - |
dc.citation.startPage | 2107 | - |
dc.citation.title | INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY | - |
dc.citation.volume | 78 | - |
dc.contributor.affiliatedAuthor | Han, Yong-Hee | - |
dc.type.docType | Article | - |
dc.subject.keywordAuthor | Production planning | - |
dc.subject.keywordAuthor | Semiconductor test | - |
dc.subject.keywordAuthor | Capacity management | - |
dc.subject.keywordAuthor | Test time reduction | - |
dc.subject.keywordAuthor | Engineering activity | - |
dc.subject.keywordAuthor | Process improvement | - |
dc.subject.keywordAuthor | Statistical decision theory | - |
dc.subject.keywordAuthor | Markov decision process | - |
dc.subject.keywordPlus | PRODUCTION RAMP-UP | - |
dc.subject.keywordPlus | PROCESS IMPROVEMENT | - |
dc.subject.keywordPlus | QUALITY | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
Soongsil University Library 369 Sangdo-Ro, Dongjak-Gu, Seoul, Korea (06978)02-820-0733
COPYRIGHT ⓒ SOONGSIL UNIVERSITY, ALL RIGHTS RESERVED.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.