Critical CuI buffer layer surface density for organic molecular crystal orientation change

Abstract

We have determined the critical surface density of the CuI buffer layer inserted to change the preferred orientation of copper phthalocyanine (CuPc) crystals grown on the buffer layer. X-ray reflectivity measurements were performed to obtain the density profiles of the buffer layers and out-of-plane and 2D grazing-incidence X-ray diffraction measurements were performed to determine the preferred orientations of the molecular crystals. Remarkably, it was found that the preferred orientation of the CuPc film is completely changed from edge-on (1 0 0) to face-on (1 1 -2) by a CuI buffer layer with a very low surface density, so low that a large proportion of the substrate surface is bare. (C) 2015 AIP Publishing LLC.