Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Common cause failure parameter estimation from generic data under masked testing schemes

Full metadata record
DC Field Value Language
dc.contributor.authorLim, T.-J.-
dc.date.available2018-05-09T08:34:56Z-
dc.date.created2018-04-17-
dc.date.issued2015-
dc.identifier.issn2185-2766-
dc.identifier.urihttp://scholarworks.bwise.kr/ssu/handle/2018.sw.ssu/9687-
dc.description.abstractThis paper deals with the inconsistency problem when we estimate the basic parameter of common cause failures from generic data in which testing schemes are masked. We propose an approximate confidence interval for the basic parameters under mixed testing scheme including both non-staggered and staggered testing. We also propose a method to obtain the unbiased estimates for the basic parameters from the generic database composed of alpha factor estimates and the total failure probability of a component. The proportion of non-staggered tests is usually unknown, but it can be estimated by stabilizing the estimates for the total probability of any two specific components’ failure for various system sizes. The proposed method will fill the gap between the estimated frequency and the experienced frequency of common cause failures in industry. © 2015 ICIC International.-
dc.publisherICIC Express Letters Office-
dc.relation.isPartOfICIC Express Letters, Part B: Applications-
dc.subjectCommon cause failure-
dc.subjectConfidence interval-
dc.subjectFailure Probability-
dc.subjectGeneric data-
dc.subjectSpecific component-
dc.subjectTesting schemes-
dc.subjectTotal probabilities-
dc.subjectUnbiased estimates-
dc.subjectParameter estimation-
dc.titleCommon cause failure parameter estimation from generic data under masked testing schemes-
dc.typeArticle-
dc.type.rimsART-
dc.identifier.bibliographicCitationICIC Express Letters, Part B: Applications, v.6, no.3, pp.771 - 777-
dc.description.journalClass1-
dc.identifier.scopusid2-s2.0-84924060020-
dc.citation.endPage777-
dc.citation.number3-
dc.citation.startPage771-
dc.citation.titleICIC Express Letters, Part B: Applications-
dc.citation.volume6-
dc.contributor.affiliatedAuthorLim, T.-J.-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.subject.keywordAuthorCommon cause failure-
dc.subject.keywordAuthorGeneric data-
dc.subject.keywordAuthorParameter estimation-
dc.subject.keywordAuthorTesting schemes-
dc.description.journalRegisteredClassscopus-
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > ETC > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Lim, Tae Jin photo

Lim, Tae Jin
Department of Industrial & Information Systems Engineering
Read more

Altmetrics

Total Views & Downloads

BROWSE