Chang, JS; Yim, EY; Jung, KC; Kim, HJ
ConferenceIssue Date2005Citation18th International Conference on Industrial and Engineering Applications of Artificial Intelligence and Expert Systems: Innovations in Applied Artificial Intelligence, IEA/AIE 2005, v.3533, pp.26 - 35PublisherSPRINGER-VERLAG BERLINISBN3540265511PlaceBari