Yeom, H.; Aida, K.; Choi, J.; Choi, Y.; Deelman, E.; Fiore, S.; Diaz, R.G.; Eom, H.; Heien, E.; Jensen, J., et al.
ArticleIssue Date2019CitationProceedings - 2018 IEEE 3rd International Workshops on Foundations and Applications of Self* Systems, FAS*W 2018, pp.XIII - XIVPublisherInstitute of Electrical and Electronics Engineers Inc.