Kim, Sungchul; Jeon, Yong Woo; Kim, Yongsik; Kong, Dongsik; Jung, Hyun Kwang; Bae, Min-Kyung; Lee, Je-Hun; Du Ahn, Byung; Park, Sei Yong; Park, Jun-Hyun, et al.
ArticleIssue Date2012CitationIEEE ELECTRON DEVICE LETTERS, v.33, no.1, pp 62 - 64PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC