Kim, Sihyun; Lee, Ryoongbin; Kwon, Daewoong; Kim, Tae-Hyeon; Park, Tae Jung; Choi, Sung-Jin; Mo, Hyun-Sun; Kim, Dae Hwan; Park, Byung-Gook
ArticleIssue Date2021CitationIEEE Sensors Journal, v.21, no.7, pp 8839 - 8846PublisherInstitute of Electrical and Electronics Engineers Inc.