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Effects of nitrogen atoms of benzotriazole and its derivatives on the properties of electrodeposited Cu films

Authors
Kim, Hoe ChulKim, Myung JunLim, TaehoPark, Kyung JuKim, Kwang HwanChoe, SeunghoeKim, Soo-KilKim, Jae Jeong
Issue Date
Jan-2014
Publisher
ELSEVIER SCIENCE SA
Keywords
Copper; Electrodeposition; Benzotriazole; Film property; Hardness
Citation
THIN SOLID FILMS, v.550, pp 421 - 427
Pages
7
Journal Title
THIN SOLID FILMS
Volume
550
Start Page
421
End Page
427
URI
https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/12603
DOI
10.1016/j.tsf.2013.10.124
ISSN
0040-6090
Abstract
Additives having azole groups with different numbers of nitrogen atoms, such as indole, benzimidazole, indazole, benzotriazole (BTA), and 1H-benzotriazole-methanol (BTA-MeOH) were adopted to improve the mechanical hardness of electrodeposited Cu films. The effects of these additives on the film properties were elucidated in relation to their number of nitrogen atoms. Electrochemical current-potential behaviors showed that the additives containing three nitrogen atoms (BTA and BTA-MeOH) more effectively inhibited Cu electrodeposition. The inhibition strongly affected the film properties, resulting in reduced grain size and surface roughness, and increased resistivity and hardness. Cu films deposited with BTA or BTA-MeOH also exhibited 35% reduced grain size and 1.5-time higher hardness than Cu films deposited in electrolyte containing other BTA-derivatives having fewer nitrogen atoms. This notable grain refining effect of BTA and BTA-MeOH can be evaluated with respect to the strong interaction of their nitrogen atoms with the substrate and the copper ions, as well. (C) 2013 Elsevier B. V. All rights reserved.
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Kim, Soo Kil
창의ICT공과대학 (융합공학부)
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