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Applications of Scanning Probe-Atomic Force Microscopy in Nanobioelectronics

Authors
Choi, EunmiKim, AreumSon, HyungbinPyo, Sung Gyu
Issue Date
Jan-2014
Publisher
AMER SCIENTIFIC PUBLISHERS
Keywords
Scanning Probe Microscopy; Atomic Force Microscopy; Nanobioelectronics; Bonding Strength
Citation
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.14, no.1, pp 924 - 931
Pages
8
Journal Title
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY
Volume
14
Number
1
Start Page
924
End Page
931
URI
https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/12645
DOI
10.1166/jnn.2014.8759
ISSN
1533-4880
1533-4899
Abstract
Scanning probe microscopy (SPM) is considered one of the most powerful tools for nanoscale studies that are becoming increasingly important, and SPM has shown rapid development. Atomic force microscopy (AFM), in particular, is the widely used SPM system. SPM, and especially AFM, has been used as a new measuring tool for phenomena that were earlier difficult to prove because of the limitations of earlier systems. In addition SPM allows acquiring nanoscale resolution images of the surface of materials. New applications are constantly being developed for SPM, and it is now used actively in material sciences and biological fields. The most important reason why SPM has attracted attention in the biological field is because it can be used in liquids as well. This allows the study of live cells and various other systems in nanoscale. Recently, there have been many advances in nanoscale studies, such as studies of cell interactions, cell changes according to environmental changes, and development of biosensors. This review is focused on applications in nanodevices, as well as on specific biological applications to discuss the development and opportunities of SPM in the biological field.
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Pyo, Sung Gyu
창의ICT공과대학 (융합공학부)
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