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Design Optimization of InAs-Based Gate-All-Around (GAA) Arch-Shaped Tunneling Field-Effect Transistor (TFET)

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dc.contributor.authorSeo, Jae Hwa-
dc.contributor.authorYoon, Young Jun-
dc.contributor.authorJo, Young-Woo-
dc.contributor.authorSon, Dong-Hyeok-
dc.contributor.authorCho, Seongjae-
dc.contributor.authorKwon, Hyuck-In-
dc.contributor.authorLee, Jung-Hee-
dc.contributor.authorKang, In Man-
dc.date.available2019-01-22T14:23:47Z-
dc.date.issued2016-10-
dc.identifier.issn1533-4880-
dc.identifier.issn1533-4899-
dc.identifier.urihttps://scholarworks.bwise.kr/cau/handle/2019.sw.cau/1770-
dc.description.abstractIn this work, an InAs-based gate-all-around (GAA) arch-shaped tunneling field-effect transistor (TFET) was designed and analyzed using technology computer-aided design (TCAD) simulations. To progress the DC/RF characteristics of GAA arch-shaped TFET, InAs, a highly attractive III-V compound material, is adopted as a channel material. Owing to the GAA arch-shaped structure of TFET, the tunneling region under the gate area is extended, and the on-state current (I-on) and subthreshold-swing (S) are improved. However, it has some performance limitations that are related to the height of the source region (H-source) and the epitaxially grown thickness of the channel (t(epi)). Thus, we performed a design optimization of the InAs-based GAA arch-shaped TFET with the variables H-source and t(epi). After the optimization process, RF characteristics such as gate capacitance, transconductance (g(m)), cutoff frequency (f(T)), and maximum oscillation frequency (f(max)) were extracted and analyzed by small-signal RF modeling. Finally, the designed InAs-based GAA arch-shaped TFET demonstrated an I-on of 10.6 mA/mu m, S of 6.5 mV/dec, f(T) of 2.3 THz, and f(max) of 20 THz.-
dc.format.extent5-
dc.publisherAMER SCIENTIFIC PUBLISHERS-
dc.titleDesign Optimization of InAs-Based Gate-All-Around (GAA) Arch-Shaped Tunneling Field-Effect Transistor (TFET)-
dc.typeArticle-
dc.identifier.doi10.1166/jnn.2016.13127-
dc.identifier.bibliographicCitationJOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.16, no.10, pp 10199 - 10203-
dc.description.isOpenAccessN-
dc.identifier.wosid000387100600006-
dc.identifier.scopusid2-s2.0-84990998400-
dc.citation.endPage10203-
dc.citation.number10-
dc.citation.startPage10199-
dc.citation.titleJOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY-
dc.citation.volume16-
dc.type.docTypeArticle-
dc.publisher.location미국-
dc.subject.keywordAuthorIII-V Compound Semiconductor-
dc.subject.keywordAuthorInAs-
dc.subject.keywordAuthorGAA-
dc.subject.keywordAuthorArch Shape-
dc.subject.keywordAuthorTFET-
dc.subject.keywordAuthorTCAD-
dc.subject.keywordPlusPOWER APPLICATION-
dc.subject.keywordPlusFET-
dc.subject.keywordPlusLAYER-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryChemistry, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.description.journalRegisteredClasssci-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
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