Power Semiconductor Module With Low-Permittivity Material to Reduce Common-Mode Electromagnetic Interference
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Shin, Jong-Won | - |
dc.contributor.author | Wang, Chi-Ming | - |
dc.contributor.author | Dede, Ercan M. | - |
dc.date.available | 2019-03-07T04:34:23Z | - |
dc.date.issued | 2018-12 | - |
dc.identifier.issn | 0885-8993 | - |
dc.identifier.issn | 1941-0107 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/1813 | - |
dc.description.abstract | The layout of a low-permittivity material is designed in a power semiconductor module to reduce parasitic common-mode (CM) capacitance and hence attenuate the CM current. Without sacrificing the thermal performance between the semiconductor devices and heat sink, a portion of the bottom copper of a direct-bond-copper substrate is replaced by air to decrease capacitance. The proposed power module is verified in a 1-kW 100-kHz buck converter. The CM current is decreased by 8 dB in the frequency domain without any additional components or filters. | - |
dc.format.extent | 5 | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.title | Power Semiconductor Module With Low-Permittivity Material to Reduce Common-Mode Electromagnetic Interference | - |
dc.type | Article | - |
dc.identifier.doi | 10.1109/TPEL.2018.2828041 | - |
dc.identifier.bibliographicCitation | IEEE TRANSACTIONS ON POWER ELECTRONICS, v.33, no.12, pp 10027 - 10031 | - |
dc.description.isOpenAccess | N | - |
dc.identifier.wosid | 000445355900003 | - |
dc.identifier.scopusid | 2-s2.0-85045743964 | - |
dc.citation.endPage | 10031 | - |
dc.citation.number | 12 | - |
dc.citation.startPage | 10027 | - |
dc.citation.title | IEEE TRANSACTIONS ON POWER ELECTRONICS | - |
dc.citation.volume | 33 | - |
dc.type.docType | Article | - |
dc.publisher.location | 미국 | - |
dc.subject.keywordAuthor | Common-mode (CM) current | - |
dc.subject.keywordAuthor | conducted electromagnetic interference (EMI) | - |
dc.subject.keywordAuthor | power semiconductor module | - |
dc.subject.keywordAuthor | parasitic capacitance | - |
dc.subject.keywordPlus | EMI-FILTER | - |
dc.subject.keywordPlus | NOISE | - |
dc.subject.keywordPlus | CONVERTERS | - |
dc.subject.keywordPlus | VOLTAGE | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.description.journalRegisteredClass | sci | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
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