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Characteristics of Pulse-Reverse Electrodeposited Cu Thin Film II. Effects of Organic Additives

Authors
Kim, Myung JunLim, TaehoPark, Kyung JuKwon, Oh JoongKim, Soo-KilKim, Jae Jeong
Issue Date
Sep-2012
Publisher
ELECTROCHEMICAL SOC INC
Citation
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.159, no.9, pp D544 - D548
Journal Title
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
Volume
159
Number
9
Start Page
D544
End Page
D548
URI
https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/20989
DOI
10.1149/2.046209jes
ISSN
0013-4651
1945-7111
Abstract
Pulse-reverse electrodeposition is capable of improving the superfilling ability and other properties of Cu in device interconnections. In this research, the influences of pulse-reverse electrodeposition on the properties of Cu thin film were investigated in the presence of organic additives used for Cu superfilling. The anodic step of pulse-reverse electrodeposition gave rise to changes in crystallinity, resistivity, grain size, and surface roughness. Minimum resistivity at the optimum dissolution ratio was observed, revealing a 14% reduction of the resistivity as compared to pulse electrodeposition samples. This was ascribed to the minimization of surface roughness produced by the selective dissolution of SPS-covered Cu as opposed to PEG-Cl--covered Cu. It was confirmed that the selectivity of the anodic step came from the adsorbates and the anodic potential, resulting in changes in the film properties. (C) 2012 The Electrochemical Society. [DOI: 10.1149/2.046209jes] All rights reserved.
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