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AC Stress-Induced Degradation of Amorphous InGaZnO Thin Film Transistor Inverter

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dc.contributor.authorKim, Dae-Hwan-
dc.contributor.authorKong, Dongsik-
dc.contributor.authorKim, Sungchul-
dc.contributor.authorJeon, Young Woo-
dc.contributor.authorKim, Yongsik-
dc.contributor.authorKim, Dong Myong-
dc.contributor.authorKwon, Hyuck-In-
dc.date.available2019-05-29T11:36:19Z-
dc.date.issued2011-09-
dc.identifier.issn0021-4922-
dc.identifier.issn1347-4065-
dc.identifier.urihttps://scholarworks.bwise.kr/cau/handle/2019.sw.cau/21281-
dc.description.abstractThe degradation of amorphous indium-gallium-zinc-oxide (a-IGZO) thin film transistor (TFT) inverter operation is investigated under AC pulse stresses. From the extraction of subgap density of states (DOSs), the dominant mechanism of the pulse stress-induced degradation of driver TFT is considered as the increase of acceptor-like deep states, while that of the load TFT is attributed to the increased number of electrons trapped into the interface and/or a-IGZO thin films. We also observe that the rising and falling time of the induced pulse affects each TFT of the inverter in a different manner, and discuss the related mechanism of this phenomenon. (C) 2011 The Japan Society of Applied Physics-
dc.language영어-
dc.language.isoENG-
dc.publisherIOP PUBLISHING LTD-
dc.titleAC Stress-Induced Degradation of Amorphous InGaZnO Thin Film Transistor Inverter-
dc.typeArticle-
dc.identifier.doi10.1143/JJAP.50.090202-
dc.identifier.bibliographicCitationJAPANESE JOURNAL OF APPLIED PHYSICS, v.50, no.9-
dc.description.isOpenAccessN-
dc.identifier.wosid000295029200003-
dc.identifier.scopusid2-s2.0-80053001206-
dc.citation.number9-
dc.citation.titleJAPANESE JOURNAL OF APPLIED PHYSICS-
dc.citation.volume50-
dc.type.docTypeArticle-
dc.publisher.location일본-
dc.subject.keywordPlusOXIDE-
dc.subject.keywordPlusINSTABILITY-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClasssci-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
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