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Noise-driven multistability in a plasma diode
- Authors
- Seo, J.T.; Pae, K.H.; Hahn, S.J.
- Issue Date
- Nov-2004
- Publisher
- AMER INST PHYSICS
- Citation
- PHYSICS OF PLASMAS, v.11, no.11, pp 5364 - 5367
- Pages
- 4
- Journal Title
- PHYSICS OF PLASMAS
- Volume
- 11
- Number
- 11
- Start Page
- 5364
- End Page
- 5367
- ISSN
- 1070-664X
1089-7674
- Abstract
- Recently, a brand-new phenomenon of competing multistability in plasma diode systems has been observed by our group [S. J. Hahn and K. H. Pae, Phys. Plasmas 10, 314 (2003)]. By employing one-dimensional particle-in-cell simulations with proper control of the inherent numerical noise, the noise-driven multistability and dynamical transitions between regular and multistable solutions have been investigated. Throughout this work, it is verified that the competing multistability is, in principle, a noise-driven dynamical switch between attractors and occurs due to noise fluctuations inside a system near the fractal basin boundaries. (C) 2004 American Institute of Physics.
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