Determination of interface dipole energy at the interface of ruthenium-oxide-coated anode with organic material using synchrotron radiation photoemission spectroscopy
- Authors
- Kim, SY; Baik, JM; Lee, JL
- Issue Date
- Jul-2005
- Publisher
- ELECTROCHEMICAL SOC INC
- Citation
- ELECTROCHEMICAL AND SOLID STATE LETTERS, v.8, no.9, pp H79 - H81
- Journal Title
- ELECTROCHEMICAL AND SOLID STATE LETTERS
- Volume
- 8
- Number
- 9
- Start Page
- H79
- End Page
- H81
- URI
- https://scholarworks.bwise.kr/cau/handle/2019.sw.cau/28038
- DOI
- 10.1149/1.1996510
- ISSN
- 1099-0062
1944-8775
- Abstract
- 4,4'-Bis[N-1-naphthyl)-N-phenylamino]biphenyl (alpha-NPD) was deposited in situ on both ruthenium oxide-coated indium-tin oxide (RuOx-ITO) and O-2-plasma-treated ITO (O-2-ITO) anodes, and their interface dipole energies were quantitatively determined using synchrotron radiation photoemission spectroscopy. The dipole energy of RuOx-ITO was lower by 0.2 eV than that of O-2-ITO even though RuOx-ITO had a higher work function. Secondary electron emission spectra after deposition of alpha-NPD on anodes revealed that the work function of RuOx-ITO is higher by 0.2 eV than that of O-2-ITO, resulting in a decrease of the turn-on voltage via reduction of hole injection barrier. (c) 2005 The Electrochemical Society. All rights reserved.
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Collections - College of Engineering > School of Chemical Engineering and Material Science > 1. Journal Articles
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